The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9678045 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 13, 2017

Filed:

Aug. 30, 2013
Applicant:

Board of Regents, the University of Texas System, Austin, TX (US);

Inventors:

Jinying Zhu, Round Rock, TX (US);

Michael R. Haberman, Austin, TX (US);

Xiaowei Dai, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10K 11/28 (2006.01); G10K 15/06 (2006.01); G01N 29/24 (2006.01); G01N 29/34 (2006.01);
U.S. Cl.
CPC ...
G01N 29/34 (2013.01); G01N 29/2431 (2013.01); G01N 29/2456 (2013.01); G10K 11/28 (2013.01); G10K 15/06 (2013.01);
Abstract

Provided are devices, systems, and methods for the testing of materials and structures. For example, the devices, systems, and methods are optionally used for the non-destructive testing of a material or structure. Furthermore, the devices, systems, and methods may optionally use a high-amplitude, air-coupled acoustic source for non-destructive testing of materials and structures.


Find Patent Forward Citations

Zhu, Jinying. (2017). Devices, systems, and methods for non-destructive testing of materials and structures (U.S. Patent No. 9678045). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9678045

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