Company Filing History:
Years Active: 2024
Title: Innovations of Xiaoqiong Du in Semiconductor Device Testing
Introduction
Xiaoqiong Du is a notable inventor based in Wuhan, China. He has made significant contributions to the field of semiconductor device testing. His innovative work has led to the development of a patent that enhances the efficiency and effectiveness of semiconductor analysis.
Latest Patents
Xiaoqiong Du holds a patent for "Methods and structures for semiconductor device testing." This patent describes a structure for performing analysis that includes a first opening formed on the back side of a substrate, passing through the substrate. It also features a second opening connected with the bottom of the first opening, penetrating into a first dielectric layer formed on the front side of the substrate. The invention includes a first conductive layer formed on the sidewall of the second opening, a contact element in the first dielectric layer, and a second conductive layer formed on a second dielectric layer. The first conductive layer contacts the second conductive layer electrically, providing a novel approach to semiconductor testing.
Career Highlights
Xiaoqiong Du is currently employed at Yangtze Memory Technologies Co., Ltd. His work at this company has allowed him to focus on advancing semiconductor technologies. His expertise in this area has positioned him as a key player in the industry.
Collaborations
Xiaoqiong Du has collaborated with several talented individuals, including Lin Qi and Juan Wang. These collaborations have fostered an environment of innovation and creativity, contributing to the success of their projects.
Conclusion
Xiaoqiong Du's contributions to semiconductor device testing through his patent and work at Yangtze Memory Technologies Co., Ltd. highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of semiconductor technology.