Champaign, IL, United States of America

Xiaoming Yu

This inventor holds 2 USPTO granted patents. Top assignee: Agere Systems Inc.. Active years: 2004-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaoming Yu. Retrieved from https://idiyas.com/inventor/xiaoming-yu-ca25u0l9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2004-2006

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2 patents (USPTO):Explore Patents

Title: Innovations of Inventor Xiaoming Yu

Introduction

Xiaoming Yu is a notable inventor based in Champaign, IL (US). He has made significant contributions to the field of circuit testing, holding 2 patents that showcase his innovative techniques.

Latest Patents

His latest patents include "Sequential test pattern generation using clock-control design for testability structures." This invention focuses on techniques for testing a sequential circuit that comprises a plurality of flip-flops or other types of registers. The circuit is configured to break feedback loops associated with the registers, allowing for the generation of test patterns that can be applied effectively. Another patent, "Sequential test pattern generation using combinational techniques," involves separating the circuit into overlapping pipelines. This method controls the clocks for the registers to break feedback loops, enabling efficient detection of target faults.

Career Highlights

Xiaoming Yu works at Agere Systems Inc., where he continues to develop innovative solutions in circuit testing. His work has significantly advanced the methodologies used in the industry.

Collaborations

Xiaoming collaborates with Miron Abramovici, who is also a key contributor in their field.

Conclusion

Xiaoming Yu's contributions to circuit testing through his patents reflect his innovative spirit and dedication to advancing technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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