The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Mar. 26, 2002
Miron Abramovici, Berkeley Heights, NJ (US);
Xiaoming Yu, Champaign, IL (US);
Miron Abramovici, Berkeley Heights, NJ (US);
Xiaoming Yu, Champaign, IL (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
Techniques for testing a sequential circuit comprising a plurality of flip-flops or other types of registers. The circuit is first configured such that substantially all feedback loops associated with the registers, other than one or more self-loops each associated with a corresponding one of the registers, are broken. Test patterns are then generated for application to the circuit. The test patterns are applied to the circuit in conjunction with partitioned clock signals each of which is associated with a corresponding level of the circuit containing at least one of the self-loops.