Xiaolang Yan

Title: Innovations of Xiaolang Yan in Optical Measurement Systems

Introduction

Xiaolang Yan is a prominent inventor based in Beijing, China. He has made significant contributions to the field of optical measurement systems, particularly through his innovative designs and patents. His work focuses on enhancing the functionality and efficiency of spectroscopic polarimeters.

Latest Patents

Xiaolang Yan holds a patent for a "Normal incidence broadband spectroscopic polarimeter and optical measurement system." This invention features a normal incidence broadband spectroscopic polarimeter that is easy to adjust for focus, free from chromatic aberration, and maintains polarization with a simple structure. The device utilizes at least one flat reflector element to change the propagation direction of the focused beam, allowing it to make normal incidence on the sample surface. Additionally, the polarimeter includes at least one polarizer to measure anisotropic or non-uniform samples, such as three-dimensional profiles and material optical constants of thin films with periodic structures.

Career Highlights

Xiaolang Yan is currently employed at Beioptics Technology Co., Ltd., where he continues to develop cutting-edge optical technologies. His expertise in the field has positioned him as a key player in advancing optical measurement systems.

Collaborations

Xiaolang has collaborated with notable colleagues, including Guoguang Li and Tao Liu, contributing to various projects that enhance the capabilities of optical measurement technologies.

Conclusion

Xiaolang Yan's innovative work in optical measurement systems exemplifies the importance of advancements in technology. His contributions, particularly through his patented designs, continue to influence the field and pave the way for future innovations.