Beijing, China

Xiaokang Wan

This inventor holds 1 USPTO granted patent. Top assignee: China Special Equipment Inspection and Research Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaokang Wan. Retrieved from https://idiyas.com/inventor/xiaokang-wan-ewpcwdb9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Xiaokang Wan: Inventor of an Eddy Current Inspection System

Introduction

Xiaokang Wan is an inventor based in Beijing, China, associated with the China Special Equipment Inspection and Research Institute. His patent work addresses inspection technology for detecting defects in pipelines.

Latest Patents

Wan is named on 1 patent: “Differential Eddy Current Internal Inspection Probe, Arrayed Probe, and Defect Inspection Device and Method.” The invention describes a probe with an excitation coil positioned between two symmetrically arranged receiving coils. Their bottom surfaces lie in the same plane.

The probe can inspect inner-surface, buried, and outer-surface defects when a pipeline is magnetized with direct current. Without direct-current magnetization, it is configured to inspect inner-surface defects. The patent also describes an arrayed probe and a defect inspection device and method.

Career Highlights

Wan’s listed patent reflects work on nondestructive pipeline inspection, using differential eddy current technology to identify defects under different magnetization conditions. His professional affiliation is the China Special Equipment Inspection and Research Institute.

Collaborations

Jinzhong Chen and Jiaxing Xin are identified as Wan’s coworkers. The provided information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Xiaokang Wan’s patent focuses on a versatile eddy current inspection approach for detecting pipeline defects, contributing to the development of inspection technology associated with his institute.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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