The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2026
Filed:
Sep. 10, 2024
China Special Equipment Inspection & Research Institute, Beijing, CN;
Jinzhong Chen, Beijing, CN;
Jiaxing Xin, Beijing, CN;
Xiaolong Li, Beijing, CN;
Runkun Lu, Beijing, CN;
Chang Liu, Beijing, CN;
Xiaokang Wan, Beijing, CN;
Abstract
A differential eddy current internal inspection probe, an arrayed probe, and a defect inspection device and method are provided. The probe includes an excitation coil, a first receiving coil, and a second receiving coil. The first receiving coil and the second receiving coil are symmetrically attached to both sides of the excitation coil, and bottom surfaces of the first receiving coil, the excitation coil and the second receiving coil are located in a same plane. When an inspected pipeline is subjected to direct current magnetization, the differential eddy current internal inspection probe is configured to inspect inner surface defects, buried defects and outer surface defects of the inspected pipeline. When the inspected pipeline is not subjected to direct current magnetization, the differential eddy current internal inspection probe is configured to inspect the inner surface defects of the inspected pipeline.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile