Shiga, Japan

Xiaoge Wang

This inventor holds 1 USPTO granted patent. Top assignee: Sekisui Chemical Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Xiaoge Wang. Retrieved from https://idiyas.com/inventor/xiaoge-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations of Xiaoge Wang in Conduction Inspection Technology.

Introduction

Xiaoge Wang is a notable inventor based in Shiga, Japan. He has made significant contributions to the field of conduction inspection technology. His innovative approach has led to the development of a unique conduction inspection device member.

Latest Patents

Xiaoge Wang holds 1 patent for his invention titled "Conduction inspection device member and conduction inspection device." This invention addresses the challenges associated with conductive parts, ensuring that cracks and voids are less likely to form. It also enhances conduction performance, even after repeated conduction tests, and minimizes contact marks on the member in contact with the tested component. The conduction inspection device member consists of a substrate, through holes, and conductive parts, with conductive particles designed to improve functionality.

Career Highlights

Xiaoge Wang is currently employed at Sekisui Chemical Co., Ltd., where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of conduction inspection devices.

Collaborations

Xiaoge Wang collaborates with Masao Sasadaira, contributing to the development of cutting-edge technologies in their field.

Conclusion

Xiaoge Wang's contributions to conduction inspection technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to improving the reliability and efficiency of conduction testing methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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