This inventor holds 1 USPTO granted patent. Top assignee: The 13Th Research Institute of China Electronics Technology Group Corporation. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: Innovations of Xiaodong Jing in Thermoreflectance Thermography
Introduction
Xiaodong Jing is a notable inventor based in Shijiazhuang, China. He has made significant contributions to the field of thermoreflectance thermography, particularly through his innovative methods that enhance measurement accuracy. His work is characterized by a focus on three-dimensional displacement compensation, which is crucial for precise thermal imaging.
Latest Patents
Xiaodong Jing holds a patent for a "Three-dimensional displacement compensation method for microscopic thermoreflectance thermography and control device." This patent outlines a comprehensive method that includes several steps: obtaining a current image of a measured element, transforming the image using Fourier transforms, determining peak point coordinates, calculating three-dimensional displacements, and compensating for these displacements. This innovative approach significantly improves the accuracy of thermal measurements in microscopic applications.
Career Highlights
Xiaodong Jing is affiliated with the 13th Research Institute of China Electronics Technology Group Corporation. His role at this esteemed institution allows him to collaborate with other experts in the field and contribute to advancements in electronic technology. His dedication to research and development has positioned him as a key figure in his area of expertise.
Collaborations
Xiaodong has worked alongside notable colleagues such as Aihua Wu and Yan Liu. Their collaborative efforts have furthered the development of innovative technologies in thermoreflectance thermography.
Conclusion
Xiaodong Jing's contributions to the field of thermoreflectance thermography through his patented methods demonstrate his commitment to innovation and precision in thermal imaging. His work continues to influence advancements in electronic technology and measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile