This inventor holds 1 USPTO granted patent. Top assignee: Olympus Ndt. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Innovations by Xiangdeng Xu in Non-Destructive Testing
Introduction
Xiangdeng Xu is an accomplished inventor based in Acton, MA (US). He has made significant contributions to the field of non-destructive testing through his innovative patent. His work focuses on enhancing the accuracy and efficiency of inspection processes using advanced technology.
Latest Patents
Xiangdeng Xu holds a patent for an "Apparatus and method for conducting and real-time application of EC probe calibration." This invention provides a system and method for non-destructive testing and inspection of test objects to detect anomalies using eddy current instruments. The instrument features an on-board calibration module that delivers probe-specific conductivity or thickness correction data across multiple testing points of a standard block with known properties. This allows for precise measurements when the same probe is used for both calibration and inspection.
Career Highlights
Xiangdeng Xu is currently employed at Olympus NDT, where he applies his expertise in developing innovative solutions for non-destructive testing. His work has been instrumental in advancing the capabilities of eddy current instruments, making them more reliable and effective for various applications.
Collaborations
Xiangdeng Xu collaborates with Paul Joseph DeAngelo, contributing to the development of cutting-edge technologies in their field. Their partnership enhances the research and innovation efforts at Olympus NDT.
Conclusion
Xiangdeng Xu's contributions to non-destructive testing through his innovative patent demonstrate his commitment to advancing technology in this critical area. His work continues to impact the industry positively, ensuring safer and more efficient inspection processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
