Xiang Zhang

Title: Xiang Zhang: Innovator in Defect Detection and Integrated Circuit Technology

Introduction

Xiang Zhang is a notable inventor based in Singapore, SG. He has made significant contributions to the fields of defect detection and integrated circuit technology. With a total of 2 patents, his work showcases innovative solutions to complex engineering challenges.

Latest Patents

Xiang Zhang's latest patents include the "Probabilistic Detect Identification" and the "Adaptive Clamp Width Adjusting Device." The "Probabilistic Detect Identification" patent provides a mechanism for detecting defects in incoming logs by extracting features and identifying patterns. This invention allows for efficient identification of defects and provides solutions to support engineers. The "Adaptive Clamp Width Adjusting Device" is designed for use in integrated circuit package process machines. It features a travel component with an adjustable clamp width, which can be modified according to the width of a workpiece, enhancing the efficiency of the manufacturing process.

Career Highlights

Throughout his career, Xiang Zhang has worked with prominent companies such as IBM and Manufacturing Integration Technology Ltd. His experience in these organizations has contributed to his expertise in developing innovative technologies.

Collaborations

Xiang has collaborated with notable individuals in his field, including Christopher G Fredericks and Tien Hiong Lee. Their combined efforts have led to advancements in technology and innovation.

Conclusion

Xiang Zhang's contributions to defect detection and integrated circuit technology highlight his role as a significant inventor in the industry. His innovative patents and collaborations reflect his commitment to advancing technology and solving engineering challenges.