International Business Machines Corporation

Manufacturing Integration Technology Ltd

Xiang Zhang

Weng Sing Tang

Tien Hiong Lee

Konstantin Levinski

Kim Mone Kwong

Teck Keong Boh

Xin Qian

Siew Hua Ng

Christopher G Fredericks

A mechanism is provided for detecting one or more defects in an incoming log. One or more features are extracted from the incoming log. Utilizing the one or more features, one or more patterns, one or more pattern sequences of the one or more patterns, and one or more proximities associated with the one or more patterns contained in the incoming log are identified. For each defect model generated for the incoming log, a set of patterns in the defect model is compared to a set of patterns in each previously identified defect model in a set of previously identified defect models. Responsive to identifying a match and responsive to set of scores associated with the match meeting or exceeding a set of probability thresholds, an identification associated with the previously identified defect model along with any solution or workaround is passed to a support engineer.

Probabilistic detect identification

The present invention describes an adaptive clamp width adjusting device () for use in an integrated circuit package process machine. The device () includes a travel component () and a fixed component (). The travel component () carries a clamp () with an adjustable width and a rotary screw () operable for such adjustment by a driven wheel (). The fixed component (), mounted on a base plate (), includes a motor () and a drive wheel () attached to the motor shaft. When the device () is in a clamp width conversion station (), the travel component () is aligned above the fixed component () so that when the base plate () is raised and the drive wheel () engages the driven wheel (), the clamp width is operable to be adjusted by the motor () according to a width of a workpiece (W).

Adaptive clamp width adjusting device

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Singapore, Singapore

Xiang Zhang