Wu Cheng-Hung

Title: **Wu Cheng-Hung: Innovator in Semiconductor Defect Detection**

Introduction

Wu Cheng-Hung is a prominent inventor based in Hsinchu, Taiwan, recognized for his contributions to the semiconductor industry. With a standout patent focused on defect detection during semiconductor fabrication, he has made a significant impact on the efficiency and quality of semiconductor manufacturing processes.

Latest Patents

Wu Cheng-Hung holds a patent titled "Detection of defects on wafer during semiconductor fabrication." This innovative patent introduces systems and techniques for identifying defects on a wafer by utilizing non-correctable error data obtained through scans. The process involves reconstructing non-correctable error data to create an error image map, which is then transformed to generate a projection. In various embodiments, advanced feature extraction transforms, such as the Hough transform and Radon transform, are employed. This projection is compared against a set of established rules to identify signatures indicative of defects within the wafer.

Career Highlights

Wu Cheng-Hung is affiliated with Taiwan Semiconductor Manufacturing Company Limited, a leading organization in the semiconductor sector. Throughout his career, he has demonstrated a commitment to advancing semiconductor technologies, ensuring higher standards and efficiency in production.

Collaborations

In his professional journey, Wu Cheng-Hung has collaborated with talented peers, including Chun-Hsien Lin and Liu Bo-Tsun. Working alongside such accomplished colleagues has further enhanced his innovative endeavors in the field of semiconductor technologies.

Conclusion

Wu Cheng-Hung stands out as a skilled inventor whose work in defect detection has the potential to revolutionize semiconductor fabrication. His contributions not only reflect his ingenuity but also underscore the importance of innovation in maintaining the high standards of modern technology.