This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nearfield Instruments B.v.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Wouter Arie De Zeeuw: Innovator in Probe Technology
Introduction
Wouter Arie De Zeeuw is a notable inventor based in Breda, Netherlands. He has made significant contributions to the field of probe technology, particularly in the area of atomic force microscopy. His innovative approach has led to the development of a unique probe cassette that enhances the efficiency of automated systems.
Latest Patents
Wouter Arie De Zeeuw holds a patent for a "Cassette for holding a probe." This invention pertains to a probe cassette designed to hold a probe, such as one used in atomic force microscopy, at a predefined holding position for automated pickup. The cassette features a main body that includes a support face for supporting the probe. Additionally, it incorporates one or more physical confinement elements formed or affixed along the support face. These elements provide a plurality of engagement faces disposed along the perimeter of the predefined holding position. The engagement faces extend in a direction out of the support face, defining a pocket for holding the probe. This pocket is dimensioned to restrict lateral movement of the probe in any direction along the support face.
Career Highlights
Wouter Arie De Zeeuw is associated with Nearfield Instruments B.V., where he applies his expertise in probe technology. His work has been instrumental in advancing the capabilities of atomic force microscopy, making it more accessible and efficient for various applications.
Collaborations
Wouter collaborates with Hamed Sadeghian Marnani, contributing to the innovative projects at Nearfield Instruments B.V. Their combined efforts have led to advancements in probe technology and its applications.
Conclusion
Wouter Arie De Zeeuw is a prominent inventor whose work in probe technology has made a significant impact in the field of atomic force microscopy. His innovative designs and collaborations continue to push the boundaries of what is possible in this area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile