This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: Woo-Ik Park: Parallel Testing of Electronic Devices
Introduction
Woo-Ik Park is an inventor associated with Chungcheongnam-do, South Korea, and Samsung Electronics Co., Ltd. His patent work addresses a method for testing multiple electronic devices efficiently.
Latest Patents
Park is listed as an inventor on 1 patent, titled “System Used to Test Plurality of DUTs in Parallel and Method Thereof.” The invention describes testing at least two devices under test (DUTs) whose input/output signal pins share a signal channel. A chip-selection signal identifies which device’s output data should be read through that shared channel, enabling the devices to be tested in parallel.
Career Highlights
Park’s listed invention focuses on a practical challenge in electronic testing: evaluating multiple devices while sharing input/output resources. The patent describes using chip-selection signals to distinguish the output of the selected device.
Collaborations
Park’s listed coworkers include Young-Gu Shin and Yong-Woon Kim. The patent information provided identifies Park’s affiliation with Samsung Electronics Co., Ltd.
Conclusion
Woo-Ik Park’s patent reflects an approach to parallel device testing that uses shared signal channels and chip selection to access the output of individual devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile