The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Feb. 12, 2004
Woo-ik Park, Chungcheongnam-do, KR;
Yong-woon Kim, Chungcheongnam-do, KR;
Young-gu Shin, Chungcheongnam-do, KR;
Woo-Ik Park, Chungcheongnam-do, KR;
Yong-Woon Kim, Chungcheongnam-do, KR;
Young-Gu Shin, Chungcheongnam-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Provided is a system and method of testing a plurality of devices under test (DUTs) in parallel. The method includes preparing at least two DUTs having input/output signal pins connected in common to one input/output signal channel and having chip selection signal pins connected to a chip selection signal channel, which provides a chip selection signal to specify one output data among output data to be outputted through the commonly connected input/output channel. The method includes reading the outputted data specified by the chip selection signal through the commonly connected input/output signal channel from one of the devices under test selected by the chip selection signal.