Seoul, South Korea

Won Seok Jeong

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Seegene, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Won Seok Jeong. Retrieved from https://idiyas.com/inventor/won-seok-jeong-qxmsxymf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Won Seok Jeong: Inventor of a Container Seal Inspection Device

Introduction

Won Seok Jeong is an inventor based in Seoul, South Korea. His patent work includes a device and method for inspecting container seals, addressing the detection of sealing conditions through an optical inspection system.

Latest Patents

Jeong is associated with 1 patent: “Seal Inspecting Device and Container Inspecting Method.” The invention describes a system that directs light along an optical path and uses a sensor to detect whether the light reaches it. A pressing module contains multiple pressing units positioned along the path. Each unit can move between a first position that blocks the light and a second position that allows it to reach the sensor, enabling inspection of a container’s seal.

Career Highlights

Jeong is associated with Seegene, Inc. His patent reflects work on inspection technology designed to assess container sealing through coordinated mechanical and optical components.

Collaborations

The provided information identifies Deog Pill Cho and Yoojun Han as Jeong’s coworkers. It does not specify their roles in the patent or describe particular collaborative projects.

Conclusion

Won Seok Jeong’s patent focuses on a practical approach to container seal inspection, combining a light source, sensor, and selectively positioned pressing units.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…