The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Dec. 22, 2022
Applicant:

Seegene, Inc., Seoul, KR;

Inventors:

Won Seok Jeong, Seoul, KR;

Deog Pill Cho, Seoul, KR;

Yoojun Han, Seoul, KR;

Hyun Jin Lim, Seoul, KR;

Assignee:

SEEGENE, INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/38 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01M 3/38 (2013.01); G01N 21/9054 (2013.01); G01N 2201/04 (2013.01); G01N 2201/06113 (2013.01);
Abstract

The present invention relates to a seal inspection device for inspecting seals of a container. Specifically, according to an embodiment of the present invention, provided is the seal inspection device for inspecting the sealing of a container, comprising: an irradiation unit for irradiating light along an optical path extending in a first direction; a sensor unit for detecting the light traveling along the optical path; and a pressing module for pressing the sealing of the container, wherein the pressing module includes a plurality of pressing units arranged on the optical path, and the pressing unit can be selectively located at a first position for blocking the light from reaching the sensor unit and a second position for allowing the light to reach the sensor unit.


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Jeong, Won. (2026). Seal inspecting device and container inspecting method (U.S. Patent No. 12768742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12768742

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