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For the Inventor, By the Inventor

Norderstedt, Germany

Wolfram Schilz

This inventor holds 4 USPTO granted patents. Top assignee: U.S. Philips Corporation. Active years: 1976-1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wolfram Schilz. Retrieved from https://idiyas.com/inventor/wolfram-schilz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 2.6

ph-index = 4

Forward Citations = 90(Granted Patents)


Company Filing History:

goldMedal4 out of 14,087 
 
U.S. Philips Corporation
 patents

Years Active: 1976-1986

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4 patents (USPTO):Explore Patents
1. 4567484 - Doppler radar measuring apparatus (1986-01-28),
2. 4361801 - Microwave method for measuring the relative moisture content of an object (1982-11-30),
3. 4238795 - Microwave range measuring system for measuring the distance of an object (1980-12-09),
4. 3941456 - Device for reducing the granulation in the transmission of optical (1976-03-02),

Title: Wolfram Schilz: Innovator in Radar and Microwave Technology

Introduction

Wolfram Schilz is a notable inventor based in Norderstedt, Germany. He has made significant contributions to the fields of radar and microwave technology, holding a total of 4 patents. His innovative work has led to advancements that enhance the functionality and reliability of various measurement systems.

Latest Patents

One of his latest patents is a Doppler radar measuring apparatus. This invention addresses the challenge of range-dependent sensitivity in RF Doppler radar systems. By periodically FM-modulating the transmitted RF signal, the apparatus reduces false alarms caused by small objects moving near the antenna. The sensitivity is adjusted to ensure accurate readings without interference from nearby movements.

Another significant patent is a microwave method for measuring the relative moisture content of an object. This method involves placing the object in a field generated by a microwave applicator. The dielectric properties of the applicator are measured to derive the moisture content of the object, utilizing known properties for both the applicator and the specific material of the object.

Career Highlights

Wolfram Schilz is currently employed at U.S. Philips Corporation, where he continues to develop innovative technologies. His work has been instrumental in enhancing the capabilities of measurement devices, particularly in the areas of radar and moisture detection.

Collaborations

Throughout his career, Schilz has collaborated with notable colleagues, including Burkhard Schiek and Manfred Rahlff. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Wolfram Schilz's contributions to radar and microwave technology exemplify the spirit of innovation. His patents reflect a commitment to improving measurement accuracy and reliability. His work continues to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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