The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 1980

Filed:

Oct. 24, 1978
Applicant:
Inventors:

Burkhard Schiek, Halstenbek, DE;

Wolfram Schilz, Norderstedt, DE;

Rolf Jacobson, Hamburg, DE;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ; G01S / ;
U.S. Cl.
CPC ...
343 14 ; 343 175 ;
Abstract

Disclosed is a microwave range measuring system for determing the distance to an object by means of the phase difference between a transmitted frequency-modulated wave and the wave reflected by and received from the object. The frequency of the transmitted microwave signal is varied between two fixed frequencies f.sub.u and f.sub.o and the signal reflected by and received from the object is converted by means of a signal converter into an intermediate frequency signal from whose total phase shift the distance is derived.


Find Patent Forward Citations

Schiek, Burkhard. (1980). Microwave range measuring system for measuring the distance of an object (U.S. Patent No. 4238795). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4238795

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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