Wetzlar, Germany

Wolfgang Langer

This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Mie Gmbh. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wolfgang Langer. Retrieved from https://idiyas.com/inventor/wolfgang-langer-epohpuhp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Wolfgang Langer: Innovator in Automatic Defect Classification

Introduction

Wolfgang Langer is a notable inventor based in Wetzlar, Germany. He has made significant contributions to the field of automatic defect classification through his innovative methods. His work has implications for various industries that rely on precise defect detection and classification.

Latest Patents

Wolfgang Langer holds a patent for a "Method of learning a knowledge-based database used in automatic defect classification." This invention relates to a method that allows the system to operate in an automatic learning mode, significantly reducing the number of user entries required. This advancement not only streamlines the process but also enhances the efficiency of defect classification.

Career Highlights

Langer is associated with Kla-Tencor Mie GmbH, a company known for its expertise in advanced semiconductor inspection and metrology solutions. His role at the company has allowed him to apply his innovative ideas in practical settings, contributing to the development of cutting-edge technologies.

Collaborations

Wolfgang Langer has worked alongside talented colleagues such as Ralf Friedrich and Detlef Schupp. Their collaborative efforts have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

In summary, Wolfgang Langer is a distinguished inventor whose work in automatic defect classification has made a significant impact. His patent reflects a commitment to innovation and efficiency in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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