North Attleborough, MA, United States of America

William R Dufresne

This inventor holds 1 USPTO granted patent. Top assignee: Synopsys, Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William R Dufresne. Retrieved from https://idiyas.com/inventor/william-r-dufresne

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: William R. Dufresne: Inventor in Circuit Verification

Introduction

William R. Dufresne is an inventor associated with North Attleborough, Massachusetts. His patent work concerns circuit-design verification, using constrained random simulation to help achieve temporal coverage goals.

Latest Patents

The provided information lists one patent for Dufresne: “Constrained Random Simulation Coverage Closure Guided by a Cover Property.” The invention describes a system that verifies a circuit design by applying random input stimuli while using a finite state automaton to monitor circuit inputs and outputs. Soft constraints associated with the automaton bias the stimuli, making it more likely that the simulation will progress through a sequence of states that satisfies a specified temporal coverage property. Dufresne is credited with 1 patent.

Career Highlights

Dufresne is associated with Synopsys, Inc., a company whose work includes electronic design automation and semiconductor design tools. His patent reflects an approach to improving simulation coverage during circuit verification.

Collaborations

The listed coworkers associated with Dufresne include Surrendra A. Dudani and Eduard Rudolf Cerny. Their names provide context for the professional network connected with his patent work.

Conclusion

William R. Dufresne’s documented invention applies constrained random simulation to guide circuit verification toward temporal coverage goals, highlighting his contribution to electronic design automation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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