Company Filing History:
Years Active: 2006
Title: The Innovations of William Pancirol
Introduction
William Pancirol is an accomplished inventor based in Prunay en Yvelines, France. He is known for his innovative contributions to measuring technology, particularly in the field of capacitive measuring systems. With a focus on precision and efficiency, Pancirol has made significant strides in the development of measuring devices.
Latest Patents
Pancirol holds a patent for a capacitive measuring system. This invention relates to a measuring device that includes at least one measuring probe, which sequentially applies a controlled supply voltage between the measuring probe and a reference element. The device integrates accumulated electric charges on the measuring probe. Additionally, it features at least one auxiliary measuring probe, which is also linked to a controlled electric supply and charge integrating means. The auxiliary measuring probe has a different capacity in relation to a potential detection zone compared to the main measuring probe. The comparative use of signals emitted by both measuring probes allows for the determination of the influence of the main measuring probe.
Career Highlights
Pancirol has made notable contributions to the field of measurement technology throughout his career. He is currently associated with Hitachi Computer Products (Europe) S.A.S., where he continues to innovate and develop advanced measuring solutions. His work has been instrumental in enhancing the accuracy and reliability of measuring devices.
Collaborations
Throughout his career, Pancirol has collaborated with talented individuals such as Claude Launay and Pascal Jordana. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies in the field of measurement.
Conclusion
William Pancirol's contributions to the field of capacitive measuring systems exemplify his dedication to innovation and technology. His work continues to influence the industry, paving the way for future advancements in measuring devices.