Hitachi Computer Product (europe) S.a.s.

William Pancirol

Joaquim Da Silva

Claude Launay

Daniel Le Reste

Philippe Parbaud

Pascal Jordana

The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.

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Prunay en Yvelines, France

William Pancirol