The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Jun. 27, 2002
Claude Launay, Champigny, FR;
Pascal Jordana, La Queue-en-Brie, FR;
Daniel Le Reste, Ferriere-en-Brie, FR;
William Pancirol, Prunay-en-Yvelines, FR;
Joaquim Da Silva, St Jean De Braye, FR;
Philippe Parbaud, La Ferte Saint Aubin, FR;
Claude Launay, Champigny, FR;
Pascal Jordana, La Queue-en-Brie, FR;
Daniel Le Reste, Ferriere-en-Brie, FR;
William Pancirol, Prunay-en-Yvelines, FR;
Joaquim Da Silva, St Jean De Braye, FR;
Philippe Parbaud, La Ferte Saint Aubin, FR;
Hitachi Computer Product (Europe) S.A.S., Olivet, FR;
Abstract
The invention relates to a measuring device including at least one measuring probe, sequentially applying a controlled supply voltage between the measuring probe and a reference element, and integrating accumulated electric charges on the measuring probe. The device also includes at least one auxiliary measuring probe, which is also sequentially linked to a controlled electric supply and to charge integrating means. The auxiliary measuring probe has a capacity, in relation to a potential detection zone, which is different from the main measuring probe. Comparative use of signals respectively emitted by the two measuring probes enables the influence of the main measuring probe to be determined.