This inventor holds 2 USPTO granted patents. Top assignee: Kla Instruments Corporation. Active years: 1985-1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1985-1986
Title: Innovations of William H Broadbent, Jr.
Introduction
William H Broadbent, Jr. is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of photomask inspection technology. With a total of 2 patents, his work focuses on improving defect detection in photomasks.
Latest Patents
Broadbent's latest patents include a "Photomask inspection apparatus and method with improved defect detection." This apparatus inspects photomasks by comparing duplicate die patterns, utilizing two-dimensional pixel representations. The system identifies defects by analyzing points of non-agreement between pixel representations. Additionally, he has developed an "Automatic system and method for inspecting hole quality." This system inspects holes in a mask using various means, including illumination and optical detection, to ensure quality and detect defects.
Career Highlights
Broadbent has had a successful career at Kla Instruments Corporation, where he has applied his expertise in photomask inspection technology. His innovative approaches have contributed to advancements in the field, enhancing the accuracy and efficiency of defect detection.
Collaborations
He has collaborated with notable coworkers such as Mark Joseph Wihl and Steve Buchholz, further enriching his work and contributions to the industry.
Conclusion
William H Broadbent, Jr. continues to be a significant figure in the realm of photomask inspection technology, with his inventions paving the way for improved quality control in manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile