Orcutt, CA, United States of America

William E Williamson

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Teledyne Flir Commercial Systems, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: William E Williamson. Retrieved from https://idiyas.com/inventor/william-e-williamson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: William E. Williamson and His Optical Imaging Patent.

Introduction

William E. Williamson is an inventor associated with Orcutt, California, and Teledyne FLIR Commercial Systems, Inc. His patent work concerns optical imaging systems and methods.

Latest Patents

Williamson is credited with 1 patent, titled “Imager Optical Systems and Methods.” The patent describes optical imager devices, systems, and methods. One example is an imaging system with a focal plane array (FPA) and a light shield. The FPA’s detector array detects a portion of electromagnetic radiation and generates a corresponding signal, which a readout circuit receives. The light shield, coupled to the FPA, blocks another portion of the radiation.

Career Highlights

Williamson’s listed patent reflects work on optical imaging technology, including detector arrays, readout circuits, and light shielding. His company affiliation is Teledyne FLIR Commercial Systems, Inc.

Collaborations

Williamson’s listed coworkers include Darren M. Haley and Royce Duane Clay, Jr. The available information identifies them as coworkers but does not specify their roles in the patent.

Conclusion

William E. Williamson’s patent focuses on an optical imaging system that combines a focal plane array with a light shield to detect and manage electromagnetic radiation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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