The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 2025

Filed:

Jan. 31, 2020
Applicant:

Teledyne Flir Commercial Systems, Inc., Goleta, CA (US);

Inventors:

Royce Duane Clay, Jr., Santa Barbara, CA (US);

Devin T. Walsh, Goleta, CA (US);

Darren M. Haley, Santa Barbara, CA (US);

William E. Williamson, Orcutt, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 23/11 (2023.01); G01J 3/28 (2006.01); H01L 31/0232 (2014.01);
U.S. Cl.
CPC ...
H04N 23/11 (2023.01); G01J 3/2803 (2013.01); G01J 3/2823 (2013.01); H01L 31/0232 (2013.01);
Abstract

Techniques are disclosed for optical imager devices, systems, and methods. In one example, an imaging system includes a focal plane array (FPA) and a light shield. The FPA includes a detector array configured to detect a first portion of electromagnetic radiation and generate a detector signal based on the first portion. The FPA further includes a readout circuit coupled to the detector array and configured to receive the detector signal. The light shield is coupled to the FPA and configured to block a second portion of the electromagnetic radiation. Related devices and methods are also provided.


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