San Mateo, CA, United States of America

William Beaton


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of William Beaton in Electronic Device Testing

Introduction

William Beaton is an accomplished inventor based in San Mateo, CA. He has made significant contributions to the field of electronic device testing, particularly through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of testing large area substrates used in various electronic applications.

Latest Patents

William Beaton holds a patent for a "Prober for electronic device testing on large area substrates." This invention describes an apparatus and method for testing large area substrates that include patterns of displays and contact points electrically coupled to the displays. The prober assembly is designed to be movable relative to the large area substrate and/or the contact points. It can be configured to test various patterns of displays and contact points on different large area substrates. Additionally, the prober assembly is capable of testing fractional sections of the large area substrate positioned on a testing table, allowing for flexibility in testing without the need to remove the prober assembly.

Career Highlights

William Beaton is currently employed at Applied Materials, Inc., a leading company in the field of materials engineering. His role involves developing innovative solutions that improve the testing processes for electronic devices. His expertise and contributions have been instrumental in advancing the technology used in the industry.

Collaborations

Throughout his career, William has collaborated with talented individuals such as Sriram Krishnaswami and Matthias Brunner. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

William Beaton's work in electronic device testing exemplifies the spirit of innovation in the technology sector. His patent for a prober assembly showcases his commitment to improving testing methodologies for large area substrates. His contributions continue to influence the industry positively.

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