The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
May. 09, 2007
Sriram Krishnaswami, Saratoga, CA (US);
Matthias Brunner, Kirchheim, DE;
William Beaton, San Mateo, CA (US);
Yong Liu, San Jose, CA (US);
Benjamin M. Johnston, Los Gatos, CA (US);
Hung T. Nguyen, Fremont, CA (US);
Ludwig Ledl, Groebenzell, DE;
Ralf Schmid, Poing, DE;
Sriram Krishnaswami, Saratoga, CA (US);
Matthias Brunner, Kirchheim, DE;
William Beaton, San Mateo, CA (US);
Yong Liu, San Jose, CA (US);
Benjamin M. Johnston, Los Gatos, CA (US);
Hung T. Nguyen, Fremont, CA (US);
Ludwig Ledl, Groebenzell, DE;
Ralf Schmid, Poing, DE;
Applied Materials, Inc., Santa Clara, CA (US);
Abstract
An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays on the large area substrate. The apparatus includes a prober assembly that is movable relative to the large area substrate and/or the contact points, and may be configured to test various patterns of displays and contact points on various large area substrates. The prober assembly is also configured to test fractional sections of the large area substrate positioned on a testing table, and the prober assembly may be configured for different display and contact point patterns without removing the prober assembly from the testing table.