Menlo Park, CA, United States of America

Willem Gerhardus Johannes Langeveld

USPTO Granted Patents = 6 

 

Average Co-Inventor Count = 1.9

ph-index = 4

Forward Citations = 74(Granted Patents)


Company Filing History:


Years Active: 2014-2022

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6 patents (USPTO):Explore Patents

Title: Innovations of Willem Gerhardus Johannes Langeveld

Introduction

Willem Gerhardus Johannes Langeveld is an accomplished inventor based in Menlo Park, CA (US). He has made significant contributions to the field of radiation detection and imaging systems. With a total of 6 patents, Langeveld's work focuses on enhancing the capabilities of X-ray systems and detection methods.

Latest Patents

Langeveld's latest patents include innovative systems and methods for Compton scatter and pulse pileup detection. These systems are designed to detect incident radiation and output signals that indicate the presence of Compton scatter. The technology involves a first detector and multiple second detectors that work together to provide accurate detection capabilities. Additionally, he has developed a portable X-ray scanner that is compact and suitable for security inspections of small items. This system features a dual source X-ray system and a two-dimensional X-ray detector for effective imaging.

Career Highlights

Throughout his career, Langeveld has worked with notable companies such as Rapiscan Systems, Inc. and Rapidscan Systems, Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in security and detection technologies.

Collaborations

Langeveld has collaborated with professionals like Joseph Bendahan and Tsahi Gozani, further enhancing his innovative projects and expanding his expertise in the field.

Conclusion

Willem Gerhardus Johannes Langeveld is a prominent inventor whose work in radiation detection and imaging systems has led to significant advancements in technology. His contributions continue to impact the industry positively.

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