The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 2015
Filed:
Sep. 19, 2014
Rapiscan Systems, Inc., Torrance, CA (US);
Willem Gerhardus Johannes Langeveld, Menlo Park, CA (US);
Joseph Bendahan, San Jose, CA (US);
Tsahi Gozani, Palo Alto, CA (US);
Michael King, Mountain View, CA (US);
Dan Strellis, San Jose, CA (US);
Edward Franco, San Mateo, CA (US);
Krystal R. Alfonso, San Jose, CA (US);
Rapidscan Systems, Inc., Torrance, CA (US);
Abstract
An inspection system for scanning cargo and vehicles is described which employs an X-ray source that includes an electron beam generator, for generating an electron beam; an accelerator for accelerating said electron beam in a first direction; and, a first set of magnetic elements for transporting said electron beam into a magnetic field created by a second set of magnetic elements, wherein the magnetic field created by said second set of magnetic elements causes said electron beam to strike a target such that the target substantially only generates X-rays focused toward a high density section in the scanned object, which is estimated in a second pulse using image data captured by a detector array in a first pulse. The electron beam direction is optimized by said X-ray source during said second pulse to focus X-rays towards said high density section based on said image data in said first pulse.