Rapiscan Systems, Inc.

Rapidscan Systems, Inc.

Willem Gerhardus Johannes Langeveld

Joseph Bendahan

Tsahi Gozani

Edward D Franco

Craig Mathew Brown

Michael Joseph King

John David Stevenson

Krystal R Alfonso

Dan Strellis

Systems and methods for detecting Compton scatter are provided. The system includes a first detector configured to detect incident radiation and output a first detector signal; more than one second detectors surrounding the first detector and configured to detect incident radiation scattered by the first detector, wherein each of the second detectors output a second detector signal, and wherein a signal decay time of the first detector signal differs from the signal decay time of the second detector signals; and a digitizer configured to receive a single input consisting of output signals from each of the first detector and the plurality of second detectors, wherein the digitizer is further configured to simultaneously digitize the signals to produce a digitized output waveform, and wherein a shape of the output waveform is indicative of a presence or an absence of a Compton scatter signal. The systems and methods are also configured to detect pulse pileup, with or without second detectors.

Systems and methods for compton scatter and/or pulse pileup detection

The present specification discloses systems for a compact and portable X-ray transmission imaging system that is used for security inspection of small items. The system includes a housing with an X-ray tunnel for receiving an article to be inspected, a conveyor for conveying the article through the tunnel, a dual source X-ray system, with a central target, for generating two overlapping cone beams, and a two-dimensional X-ray detector system for detecting the generated dual energy X-rays.

Portable X-ray scanner

The invention provides an X-ray source having a generator for generating an electron beam, an accelerator for accelerating the generated electron beam in a desired direction, one or more magnetic elements for transporting portions of the electron beam in a more than one desired direction, and a shaped target made from a material having an atomic number lying within a predetermined range of values, the transported parts of the electron beam producing a fan beam of X rays upon striking the shaped target.

System and method for X-ray source weight reduction

An inspection system for scanning cargo and vehicles is described which employs an X-ray source that includes an electron beam generator, for generating an electron beam; an accelerator for accelerating said electron beam in a first direction; and, a first set of magnetic elements for transporting said electron beam into a magnetic field created by a second set of magnetic elements, wherein the magnetic field created by said second set of magnetic elements causes said electron beam to strike a target such that the target substantially only generates X-rays focused toward a high density section in the scanned object, which is estimated in a second pulse using image data captured by a detector array in a first pulse. The electron beam direction is optimized by said X-ray source during said second pulse to focus X-rays towards said high density section based on said image data in said first pulse.

Low-dose radiographic imaging system

The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.

High-energy X-ray-spectroscopy-based inspection system and methods to determine the atomic number of materials

The application discloses systems and methods for determining an atomic number of a material being scanned by generating a predetermined number of transmission data samples, determining a variance of the transmission data samples, and determining the atomic number of the material being scanned by comparing the variance or a derivative of the variance of the transmission data samples to one or more predetermined variances. The application also discloses systems and methods for determining an atomic number of a material being scanned by deriving transmission signal samples of the material being scanned, determining a variance of the signal samples, and determining an atomic number of the material being scanned by comparing the variance of the signal samples, or a derivative of the variance, to one or more predetermined variances.

Growing community of inventors

Menlo Park, CA, United States of America

Willem Gerhardus Johannes Langeveld