This inventor holds 6 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Rapiscan Systems, Inc.. Active years: 2011-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2011-2016
Title: Innovations of Willem G J Langeveld
Introduction
Willem G J Langeveld is a notable inventor based in Menlo Park, CA. He has made significant contributions to the field of scanning technology, holding a total of 6 patents. His work focuses on developing advanced systems and methods that enhance the capabilities of scanning objects.
Latest Patents
Langeveld's latest patents include innovative technologies such as "Systems and methods for scanning objects." This patent discloses scanner systems equipped with a radiation generator that irradiates an object, a detector that captures the radiation after interaction with the object, and processors that process the detector data to generate control outputs. Another significant patent is the "Method and system for extracting spectroscopic information from images and waveforms." This application outlines systems and methods for determining the atomic number of a material being scanned by generating transmission data samples and analyzing their variance.
Career Highlights
Willem G J Langeveld is currently employed at Rapiscan Systems, Inc., where he continues to innovate in the field of scanning technology. His work has been instrumental in advancing the capabilities of scanning systems, making them more efficient and effective.
Collaborations
Langeveld has collaborated with notable colleagues such as William A Johnson and Roger D Owen, contributing to the development of cutting-edge technologies in his field.
Conclusion
Willem G J Langeveld's contributions to scanning technology through his patents and collaborations highlight his role as a leading inventor in this domain. His innovative work continues to shape the future of scanning systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
