The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2013

Filed:

Sep. 29, 2011
Applicants:

Willem G. J. Langeveld, Menlo Park, CA (US);

William A. Johnson, La Honda, CA (US);

Roger D. Owen, Modesto, CA (US);

Russell G. Schonberg, Los Altos Hills, CA (US);

Inventors:

Willem G. J. Langeveld, Menlo Park, CA (US);

William A. Johnson, La Honda, CA (US);

Roger D. Owen, Modesto, CA (US);

Russell G. Schonberg, Los Altos Hills, CA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present application is directed toward an X-ray scanning system having a plurality of detectors and a controller, where a) the controller is configured to receive and identify a minimum X-ray transmission level detected by at least one detector, b) the controller compares the minimum X-ray transmission level to at least one predetermined threshold transmission level, and c) based on said comparison, the controller generates an adjustment signal. The present application further comprises an X-ray source, where the X-ray source receives an adjustment signal and is configured to adjust an X-ray pulse duration based on the adjustment signal.


Find Patent Forward Citations

Loading…