Princeton, NJ, United States of America

Will Zou

This inventor holds 1 USPTO granted patent. Top assignee: Nec Laboratories America, Inc.. Active years: 2015.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Will Zou - Innovator in Object Detection Technology

Introduction

Will Zou is a prominent inventor based in Princeton, NJ (US). He has made significant contributions to the field of object detection through his innovative work. His expertise lies in developing advanced systems and methods that enhance the capabilities of convolutional neural networks.

Latest Patents

Will Zou holds a patent titled "Regionlets with shift invariant neural patterns for object detection." This patent describes systems and methods for detecting an object in an image by determining convolutional neural network responses on the image. It involves mapping the responses back to their spatial locations in the image and constructing features that densely extract shift invariant activations of a convolutional neural network to produce dense features for the image. He has 1 patent to his name.

Career Highlights

Will Zou is currently employed at NEC Laboratories America, Inc., where he continues to push the boundaries of technology. His work focuses on integrating machine learning techniques with practical applications in image processing and object detection.

Collaborations

Throughout his career, Will has collaborated with talented individuals such as Xiaoyu Wang and Yuanqing Lin. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Will Zou is a dedicated inventor whose work in object detection technology is paving the way for future advancements. His contributions are not only valuable to his company but also to the broader field of artificial intelligence and machine learning.

Profile summary based on public USPTO records.
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