The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 2015
Filed:
Oct. 17, 2014
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Xiaoyu Wang, Sunnyvale, CA (US);
Yuanqing Lin, Sunnyvale, CA (US);
Will Zou, Princeton, NJ (US);
Miao Sun, Princeton, NJ (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/66 (2006.01);
U.S. Cl.
CPC ...
G06K 9/66 (2013.01);
Abstract
Systems and methods are disclosed for detecting an object in an image by determining convolutional neural network responses on the image; mapping the responses back to their spatial locations in the image; and constructing features densely extract shift invariant activations of a convolutional neural network to produce dense features for the image.