Wilfried Favre

This inventor holds 7 USPTO granted patents and 1 published patent application, plus 1 CIPO patent and 7 EPO patents. Top assignees: Commissariat a L'energie Atomique Et Aux Energies Alternatives, Norwegian University of Life Sciences. Active years: 2019-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wilfried Favre. Retrieved from https://idiyas.com/inventor/wilfried-favre

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7 (Patent Applications = 1)

% Patents Active = 100.0

CIPO Patents = 1 (Patent Applications = 1)

EPO Patents = 7 (Patent Applications = 11)

Average Co-Inventor Count = 3.5

ph-index = 1

Forward Citations = 1(Granted Patents)

Location History:

Chambéry, FR (2019 - 2021)
Chambery, FR (2021 - 2022)
Grenoble, FR (2024)

Company Filing History:

7 out of 8,827

Commissariat a L'energie Atomique Et Aux Energies Alternatives

patents

1 out of 5

Norwegian University of Life Sciences

patents

where one patent can have more than one assignee

Years Active: 2019-2024

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7 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11982623 - Analysis of defects of at least one type from among a plurality of types of defects between at least two samples (2024-05-14),

2. 11946869 - Method for determining the thermal donor concentration of a semiconductor sample (2024-04-02),

3. 11862738 - Photovoltaic cell with passivated contacts and with non-reflective coating (2024-01-02),

4. 11359305 - Method for validating the thermal history of a semiconductor ingot (2022-06-14),

5. 11077469 - Method for sorting silicon wafers according to their bulk lifetime (2021-08-03),

6. 11031907 - Method and system for monitoring the quality of photovoltaic cells (2021-06-08),

7. 10230328 - Method and system for monitoring the quality of photovoltaic cells (2019-03-12),

Title: Wilfried Favre: Innovator in Semiconductor Analysis

Introduction

Wilfried Favre is a notable inventor based in Chambery, France. He has made significant contributions to the field of semiconductor analysis, holding a total of seven patents. His work focuses on innovative methods for analyzing defects in semiconductor materials and determining thermal donor concentrations.

Latest Patents

Among his latest patents is a method for analyzing defects of various types between two samples. This method involves creating a minimap for each sample that represents the quantity of defects, allowing for a detailed comparison. Another significant patent involves determining the thermal donor concentration of a semiconductor sample. This method utilizes photoluminescence signals to establish a relationship between thermal donor concentration and specific parameters, enabling accurate measurements.

Career Highlights

Wilfried has worked with prominent organizations such as the Commissariat à l'Énergie Atomique et aux Énergies Alternatives and the Norwegian University of Life Sciences. His experience in these institutions has allowed him to refine his expertise in semiconductor technology and defect analysis.

Collaborations

Throughout his career, Wilfried has collaborated with talented individuals, including Elénore Letty and Jordi Veirman. These partnerships have contributed to the advancement of his research and innovations.

Conclusion

Wilfried Favre's contributions to semiconductor analysis through his innovative patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in technology and materials science.

Profile summary based on public USPTO records.