Whitson G Waldo, Iii

Title: Whitson G Waldo, III: Innovator in Integrated Circuit Testing

Introduction

Whitson G Waldo, III is a notable inventor based in Hutto, TX (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 8 patents. His innovative work has advanced the technology used in electronic devices.

Latest Patents

Waldo's latest patents include a "Method and apparatus for testing an integrated circuit" and a "Method for patterning an X-ray master mask." The first patent describes an apparatus and method for laser ablating residue off of probe tips. In this invention, the probe tips of the probe needles contact the test pads of an integrated circuit on a wafer. Over time, these probe tips accumulate residue from contact with various integrated circuit wafer layers. This residue can be effectively vaporized using laser light, which is directed to the probe tips via a fiber optic cable. The second patent outlines a method of patterning an X-ray master mask using reduction projection, where a photoactive material coating a plating base layer is exposed to a pattern in a reduction projection tool.

Career Highlights

Waldo has had a distinguished career, working at Motorola Corporation, where he has been able to apply his innovative ideas in practical settings. His work has not only contributed to the advancement of technology but has also enhanced the efficiency of integrated circuit testing.

Collaborations

Throughout his career, Waldo has collaborated with notable colleagues, including Franco Cerrina and David A Abercrombie. These collaborations have fostered an environment of innovation and creativity, leading to the development of groundbreaking technologies.

Conclusion

Whitson G Waldo, III is a prominent inventor whose work in integrated circuit testing has made a lasting impact on the industry. His patents reflect his commitment to innovation and excellence in technology.