Xiamen, China

Wenyu Kang

This inventor holds 1 USPTO granted patent. Top assignee: Xiamen University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wenyu Kang. Retrieved from https://idiyas.com/inventor/wenyu-kang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Wenyu Kang: Innovator in SiC High-Speed Growth Methods

Introduction

Wenyu Kang is a prominent inventor based in Xiamen, China. He has made significant contributions to the field of semiconductor technology, particularly in the growth of silicon carbide (SiC) materials. His innovative methods have the potential to enhance the efficiency and quality of semiconductor devices.

Latest Patents

Wenyu Kang holds a patent titled "Method for SiC Step Flow Growth by Regulating Growth Monomers Using Chemical Potential Under Non-Equilibrium Condition." This method focuses on achieving high-speed growth of SiC by utilizing a C-rich process with specific ratios of silicon and carbon. The technique allows for rapid epitaxial layer growth while maintaining excellent surface roughness and lower ionized doping concentrations.

Career Highlights

Kang is affiliated with Xiamen University, where he conducts research and development in semiconductor materials. His work has garnered attention for its innovative approach to enhancing the growth processes of SiC, which is crucial for various electronic applications.

Collaborations

Wenyu Kang has collaborated with notable colleagues, including Haonan Chen and Junyong Kang. These partnerships have contributed to the advancement of research in the field of semiconductor technology.

Conclusion

Wenyu Kang's contributions to the field of SiC growth methods exemplify the importance of innovation in semiconductor technology. His patented methods are paving the way for advancements in the efficiency and quality of electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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