This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Abb Schweiz Ag. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Innovations by WenLong Li in Paint Defect Detection
Introduction
WenLong Li is an accomplished inventor based in Baden, Switzerland. He has made significant contributions to the field of machine learning, particularly in the area of paint defect detection. His innovative approach combines advanced technology with practical applications, showcasing his expertise and creativity.
Latest Patents
WenLong Li holds a patent for "Systems and methods for paint defect detection using machine learning." This patent describes a method for detecting paint defects on objects. The method involves projecting a variety of patterns onto the surface of an object with different characteristics. It captures multiple images of the object based on these projections. The images are then input into a machine learning model to determine if the surface contains any paint defects. If a defect is detected, the relevant image is displayed, highlighting the issue.
Career Highlights
WenLong Li is currently employed at Abb Schweiz AG, where he applies his skills in machine learning and innovation. His work at the company emphasizes the importance of quality control in manufacturing processes, particularly in the automotive and industrial sectors. His contributions have helped improve the efficiency and accuracy of defect detection.
Collaborations
WenLong Li collaborates with his coworker, Amber-FengQin Zhu, to further enhance their research and development efforts. Together, they work on projects that leverage machine learning to solve complex problems in various industries.
Conclusion
WenLong Li's innovative work in paint defect detection exemplifies the intersection of technology and practical application. His contributions to the field of machine learning continue to pave the way for advancements in quality control and manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
