The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Jan. 26, 2021
Applicant:

Abb Schweiz Ag, Baden, CH;

Inventors:

Nevroz Sen, Los Gatos, CA (US);

Wenlong Li, Baden, CH;

Amber-Fengqin Zhu, Shanghai, CN;

Kun Chang, Shanghai, CN;

Assignee:

ABB Schweiz AG, Baden, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30156 (2013.01);
Abstract

A method for detecting paint defects on objects is provided. The method comprises: projecting a plurality of patterns on a surface of an object at a plurality of different pattern characteristics; capturing a plurality of images of the object based on projecting the plurality of patterns; inputting the plurality of images of the object into a machine learning model to determine whether the surface of the object includes one or more paint defects; and based on determining, an image, of the plurality of images, includes a paint defect, causing display of the image with the paint defect.


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