Austin, TX, United States of America

Wendell D Miller


Average Co-Inventor Count = 2.5

ph-index = 4

Forward Citations = 49(Granted Patents)


Company Filing History:


Years Active: 1980-1987

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5 patents (USPTO):Explore Patents

Title: Wendell D. Miller: Innovator in X-ray Fluorescence Technology

Introduction

Wendell D. Miller is a notable inventor based in Austin, TX, recognized for his contributions to the field of materials analysis through X-ray fluorescence technology. With a total of 5 patents, Miller has developed innovative solutions that enhance the analysis of metal alloys and other materials.

Latest Patents

Miller's latest patents include a "Probe for an apparatus for analyzing metals by X-ray fluorescence" and a "Portable apparatus for analyzing metals by X-ray fluorescence." The first patent describes an apparatus that features a hand-held probe unit connected to an electronic unit. This probe unit contains a radiation detector and a radiation source, designed to analyze metal alloys effectively. The unique design of the source housing allows for contact measurements in hard-to-reach areas. The second patent outlines a portable apparatus that utilizes a hand-held probe to analyze material samples. This device includes a radiation source and a detector that generates signals representing the elements in the sample. The electronic unit processes these signals, allowing for the identification of materials based on stored data.

Career Highlights

Miller is currently employed at Ramsey Engineering Company, where he continues to innovate in the field of materials analysis. His work has significantly impacted the way metal alloys are analyzed, providing more efficient and accurate methods for various applications.

Collaborations

Miller has collaborated with notable coworkers such as Tom Lee Erb and Peter F. Berry, contributing to advancements in their shared field of expertise.

Conclusion

Wendell D. Miller's innovative work in X-ray fluorescence technology has made a lasting impact on materials analysis. His patents reflect a commitment to improving the efficiency and accuracy of metal analysis, showcasing his role as a significant contributor to the field.

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