The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 1984

Filed:

Oct. 21, 1982
Applicant:
Inventors:

Peter F Berry, Austin, TX (US);

Wendell D Miller, Austin, TX (US);

John L Nethery, Jr, Austin, TX (US);

Assignee:

Ramsey Engineering Company, St. Paul, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 45 ; 3401462 ; 364498 ; 378 48 ;
Abstract

A portable apparatus for analyzing a sample of material by the X-ray fluorescence method includes a hand-held probe unit connected to an electronic unit. The probe unit includes a radiation source for radiating the material sample and a radiation detector responsive to the X-ray radiation from the material sample for generating a plurality of sample signals representing the elements in the material sample. The probe and electronic units each include a universal asynchronous receiver transmitter for transmitting the sample signals from the probe unit to the electronic unit. The electronic unit includes random access memories for storing the sample signals and a library of groups of signals representing the elements of known materials. A keyboard is provided for adding signals to the library and/or storing the sample signals in the library. A microprocessor and associated circuitry compare the sample signals with the stored groups of signals and generate an identification signal if a match is found. A liquid crystal display and driving circuitry are responsive to the identification signal to generate an indication of the identity of the material sample. Additionally, the apparatus is adapted to permit elemental analysis of a given alloy sample.


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