Austin, TX, United States of America

Peter F Berry


Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 1976-1987

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4 patents (USPTO):Explore Patents

Title: Peter F Berry: Innovator in X-ray Fluorescence Technology

Introduction

Peter F Berry is a notable inventor based in Austin, TX, who has made significant contributions to the field of materials analysis through his innovative work in X-ray fluorescence technology. With a total of 4 patents to his name, Berry has developed advanced apparatuses that enhance the analysis of metal alloys and other materials.

Latest Patents

Among his latest patents, Berry has created a "Probe for an Apparatus for Analyzing Metals by X-ray Fluorescence." This apparatus features an electronic unit connected to a hand-held probe unit, which includes a radiation detector and a radiation source. The design allows for contact measurements in hard-to-reach areas, making it a valuable tool for material analysis. Another significant patent is the "Portable Apparatus for Analyzing Metals by X-ray Fluorescence." This portable device enables users to analyze material samples efficiently, utilizing a hand-held probe unit that communicates with an electronic unit to generate identification signals based on the elements present in the sample.

Career Highlights

Throughout his career, Berry has worked with reputable companies, including Ramsey Engineering Company and G.D. Searle & Company. His experience in these organizations has contributed to his expertise in developing innovative technologies for material analysis.

Collaborations

Berry has collaborated with notable individuals in his field, including Wendell D Miller and John L Nethery, Jr. These partnerships have likely fostered the exchange of ideas and advancements in technology.

Conclusion

Peter F Berry's contributions to X-ray fluorescence technology have established him as a key figure in the field of materials analysis. His innovative patents and collaborations reflect his commitment to advancing the capabilities of material analysis tools.

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