Wenbin Tian

Title: Innovations of Wenbin Tian in Dynamic Impedance Imaging

Introduction

Wenbin Tian is a notable inventor based in Beijing, China. He has made significant contributions to the field of dynamic impedance imaging, showcasing his expertise through his innovative patent.

Latest Patents

Wenbin Tian holds a patent for a dynamic impedance imaging system. This system includes a dynamic impedance imaging sensor, an impedance detection and flow rate measurement module, and an electrical impedance tomography (EIT) instrument. The impedance detection and flow rate measurement module is designed to detect abnormal particles flowing through the sensor, allowing for the measurement of their flow rate and the generation of a synchronous trigger signal. The EIT instrument injects a sinusoidal excitation current into the sensor, performing multi-channel interleaved sampling based on the flow rate to acquire and calibrate multi-channel sampled data, ultimately implementing impedance tomography imaging for the abnormal particles.

Career Highlights

Wenbin Tian is affiliated with Beihang University, where he continues to advance his research and development in the field of impedance imaging. His work has garnered attention for its innovative approach and practical applications.

Collaborations

Wenbin collaborates with esteemed colleagues such as Jiangtao Sun and Xu Bai, contributing to a dynamic research environment that fosters innovation and discovery.

Conclusion

Wenbin Tian's contributions to dynamic impedance imaging highlight his role as a leading inventor in this specialized field. His innovative patent and collaborative efforts at Beihang University underscore the importance of his work in advancing technology.