The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Aug. 26, 2021
Applicant:

Beihang University, Beijing, CN;

Inventors:

Jiangtao Sun, Beijing, CN;

Xu Bai, Beijing, CN;

Lijun Xu, Beijing, CN;

Wenbin Tian, Beijing, CN;

Yuedong Xie, Beijing, CN;

Assignee:

BEIHANG UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/06 (2006.01); A61B 5/0536 (2021.01); A61B 5/0265 (2006.01);
U.S. Cl.
CPC ...
G01N 27/06 (2013.01); A61B 5/0536 (2013.01); A61B 5/0265 (2013.01);
Abstract

A dynamic impedance imaging system includes a dynamic impedance imaging sensor, an impedance detection and flow rate measurement module and an electrical impedance tomography (EIT) instrument. The impedance detection and flow rate measurement module is configured to detect an abnormal particle flowing through the dynamic impedance imaging sensor to obtain a flow rate of the abnormal particle, and generate a synchronous trigger signal. The EIT instrument is configured to inject a sinusoidal excitation current into the dynamic impedance imaging sensor under the trigger of the synchronous trigger signal, perform multi-channel interleaved sampling for the abnormal particle according to the flow rate to acquire multi-channel sampled data, and calibrate the multi-channel sampled data to implement impedance tomography imaging for the abnormal particle.


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