Wen-Jen Ho

Title: Innovations by Wen-Jen Ho

Introduction

Wen-Jen Ho is a notable inventor based in Qionglin Township, Taiwan. He has made significant contributions to the field of image sensor technology, holding a total of 3 patents. His work focuses on enhancing the functionality and efficiency of image capture systems.

Latest Patents

One of his latest patents is the "Image sensor testing probe card." This invention involves a probe card designed for testing wafers, incorporating a printed circuit board (PCB) with a conductor pattern and a probe head made of an electrically insulating material. The probe head features holes that accommodate conductive pogo pins, which connect electrically to the PCB. Additionally, the patent includes a conductive probe pin with a cantilever portion that connects to the pogo pin, allowing for electrical connectivity to the wafer.

Another significant patent is the "Enclosure for image capture systems with focusing capabilities." This invention describes an enclosure that houses an image capture unit and a solid-state die, providing focusing capabilities for the lens unit. The enclosure not only electrically couples the solid-state die to the image capture unit but also serves as electromagnetic interference (EMI) shielding for the system.

Career Highlights

Wen-Jen Ho is currently employed at Omnivision Technologies, Inc., where he continues to innovate in the field of image sensor technology. His work has contributed to advancements in image capture systems, making them more efficient and effective.

Collaborations

Throughout his career, Wen-Jen has collaborated with talented individuals such as Wei-Feng Lin and Yi-Chang Hsieh, who have also contributed to the field of image sensor technology.

Conclusion

Wen-Jen Ho's innovative patents and contributions to image sensor technology highlight his role as a significant inventor in the industry. His work continues to influence advancements in image capture systems, showcasing the importance of innovation in technology.