The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2014

Filed:

Jun. 08, 2011
Applicants:

Zheng Du, San Jose, CA (US);

Denis Chu, Fremont, CA (US);

Yi-chang Hsieh, Hsinchu, TW;

Wei-feng Lin, Hsinchu, TW;

Wen-jen Ho, Qionglin Township, TW;

Inventors:

Zheng Du, San Jose, CA (US);

Denis Chu, Fremont, CA (US);

Yi-Chang Hsieh, Hsinchu, TW;

Wei-Feng Lin, Hsinchu, TW;

Wen-Jen Ho, Qionglin Township, TW;

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/232 (2006.01); G03B 13/36 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2257 (2013.01); H04N 5/23212 (2013.01); G03B 13/36 (2013.01);
Abstract

Embodiments of the invention describe an enclosure for an image capture system that includes an image capture unit and a solid state die to provide focusing capabilities for a lens unit of the image capture unit. The enclosure may electrically couple the solid state die to the image capture unit and/or other system circuitry. The enclosure may further serve as EMI shielding for the image capture system.


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