Wen-Chang Cheng

This inventor holds 23 USPTO granted patents, primarily in Memory Testing Technology. Top assignee: Nan Ya Technology Corporation. Active years: 2007-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wen-Chang Cheng. Retrieved from https://idiyas.com/inventor/wen-chang-cheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 23

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 5

Forward Citations = 59(Granted Patents)

Location History:

Tao-Yuan, TW (2007 - 2015)
Taoyuan County, TW (2009 - 2016)

Company Filing History:

23 out of 2,580

Nan Ya Technology Corporation

patents

Years Active: 2007-2016

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Areas of Expertise:

Memory Control Method

Phase Detection

Signal Adjusting System

Charge Pump

Sensing Amplifier

Delay Line Circuit

Voltage Compensation

Duty Cycle Correction

Clock Receivers

Frequency Detector

Semiconductor Circuits

Latency Counter

23 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9354274 - Circuit test system electric element memory control chip under different test modes (2016-05-31),

2. 9076558 - Memory test system and memory test method (2015-07-07),

3. 8791737 - Phase-locked loop and method for clock delay adjustment (2014-07-29),

4. 8593197 - Delay line circuit, delay locked loop and tester system including the same (2013-11-26),

5. 8189415 - Sensing amplifier applied to at least a memory cell, memory device, and enhancement method for boosting the sensing amplifier thereof (2012-05-29),

6. 8106685 - Signal receiver and voltage compensation method (2012-01-31),

7. 8085608 - Signal adjusting system and signal adjusting method (2011-12-27),

8. 7961016 - Charge pump and charging/discharging method capable of reducing leakage current (2011-06-14),

9. 7876140 - Signal adjusting system and signal adjusting method (2011-01-25),

10. 7786764 - Signal receiver and voltage compensation method thereof (2010-08-31),

11. 7777528 - Phase detection module and phase detection method (2010-08-17),

12. 7724055 - Clock receivers (2010-05-25),

13. 7675335 - Phase detecting module and related phase detecting method (2010-03-09),

14. 7612587 - Semiconductor circuits (2009-11-03),

15. 7605630 - Delay circuit (2009-10-20),

Title: Innovations by Wen-Chang Cheng: Pioneering Circuit and Memory Test Systems

Introduction

Wen-Chang Cheng is an innovative inventor based in Taoyuan, Taiwan, recognized for his significant contributions to the field of electronic circuit testing and memory systems. With a remarkable portfolio of 23 patents, Cheng has demonstrated a strong commitment to advancing technology and improving testing methodologies in electronic devices.

Latest Patents

Among his recent inventions, Cheng has developed a circuit test system that utilizes an electric element memory control chip operating under different test modes. This system includes a circuit test apparatus that provides a first clock signal to a circuit being tested, featuring multiple input/output pads that form a test loop during specific testing phases. Notably, this circuit multiplies the frequency of the first clock signal to generate a higher frequency second clock signal, enhancing the testing capabilities of the involved circuitry.

Additionally, Cheng has introduced a comprehensive memory test system that comprises a control unit, data reading and writing channels, and a test channel. This innovative system enables efficient data handling by allowing the control unit to command the reading and writing of data at timed intervals, facilitating accurate testing and verification of memory units.

Career Highlights

Currently, Wen-Chang Cheng is employed at Nan Ya Technology Corporation, a company known for its cutting-edge advancements in technology. His tenure at this leading corporation reflects his expertise in the realm of electronic innovations and his ability to collaborate on impactful projects.

Collaborations

Cheng has worked closely with colleague Chuan-Jen Chang, showcasing a collaborative spirit that fosters innovation and problem-solving within their projects. Together, they are leveraging their expertise to push the boundaries of technology in circuit testing and memory systems.

Conclusion

Wen-Chang Cheng continues to make significant strides in the field of electronic innovations. His latest patents not only enhance the efficiency of electronic testing but also exemplify his dedication to advancing technology. As a prominent inventor, Cheng's work at Nan Ya Technology Corporation helps to shape the future of electronic systems.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]